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Characterization of current injection mechanism in Schottky-barrier metal-oxide-semiconductor field-effect transistors
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10.1063/1.3204439
/content/aip/journal/apl/95/8/10.1063/1.3204439
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/8/10.1063/1.3204439
/content/aip/journal/apl/95/8/10.1063/1.3204439
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/content/aip/journal/apl/95/8/10.1063/1.3204439
2009-08-25
2014-11-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of current injection mechanism in Schottky-barrier metal-oxide-semiconductor field-effect transistors
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/8/10.1063/1.3204439
10.1063/1.3204439
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