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SCM images of the APD structure with the AFM laser spot at (a) the normal site and (b) away from the front edge of the cantilever. (c) SCM profiles along the growth direction of sample for four different laser spot sites which are sketched at the right.
vs dc bias plot at the center point of InGaAs absorption layer under dark background.
SCM profiles at a series of dc bias under strong background illumination.
The calculated energy band profiles at the surface as well as that in the bulk along the growth direction.
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