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Characterization of the quality of ZnO thin films using reflective second harmonic generation
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15.Y. T. Zhang, G. T. Du, D. L. Liu, X. Q. Wang, Y. Ma, J. Z. Wang, J. Z. Yin, X. T. Yang, X. K. Hou, and S. R. Yang, J. Cryst. Growth 243, 439 (2003).
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