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Characterization of the quality of ZnO thin films using reflective second harmonic generation
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10.1063/1.3216848
/content/aip/journal/apl/95/9/10.1063/1.3216848
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/9/10.1063/1.3216848
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD spectra of ZnO films at the rf power of 40, 60, 80, and 100 W.

Image of FIG. 2.
FIG. 2.

patterns of ZnO thin films at the various rf powers. The values of were 31°, 33°, 43°, and 109° for the rf power of 40, 60, 80, and 100 W, respectively.

Image of FIG. 3.
FIG. 3.

The value of and at the various rf powers.

Image of FIG. 4.
FIG. 4.

The shifting angle at the various rf powers : net direction of grain boundary.

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/content/aip/journal/apl/95/9/10.1063/1.3216848
2009-08-31
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of the quality of ZnO thin films using reflective second harmonic generation
http://aip.metastore.ingenta.com/content/aip/journal/apl/95/9/10.1063/1.3216848
10.1063/1.3216848
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