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Depth-profiling of elastic inhomogeneities in transparent nanoporous low- materials by picosecond ultrasonic interferometry
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View: Figures


Image of FIG. 1.
FIG. 1.

(a) Schematic of the time-resolved interferometric detection in transparent films of an acoustic strain pulse (dashed line). (b) Transient reflectivity obtained with and . (c) The oscillations with background removed and high frequencies filtered out. (d) Time-derivative of the signal in (c). (e) Time-frequency transform of the signal in (d), where the arrows indicate the times of strain pulse reflection from the film surfaces. (f) Processed signal for the transient reflectivity. (g) Windowed time-frequency transform of the signal in (f). [(h) and (i)] the same as in (f) and (g) but for and .

Image of FIG. 2.
FIG. 2.

(a) Linear and exponential variations in the instantaneous frequency with time deduced by fitting the data in Fig. 1(i) and (c), respectively. (b) Time-domain demonstration of a nonmonochromatic character of the oscillations in Fig. 1(h). (c) Best fit of the data in Fig. 1(h) by a sinusoidal oscillation with a time-varying frequency. (d) Measured variations in sound velocity and longitudinal modulus through the depth of the low- nanoporous film.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Depth-profiling of elastic inhomogeneities in transparent nanoporous low-k materials by picosecond ultrasonic interferometry