Full text loading...
Powder x-ray diffraction patterns for samples with , 0.10, 0.15, and 0.20. Backscattered electron images for the samples with (b) and 0.20 (c). The white phase is the phase.
Temperature dependence of resistivity normalized to (300 K) for . The curves are vertically offset and separated by 0.2 units for clarity. Inset: enlarged temperature dependence of the resistivity around .
(a) Temperature dependence of magnetization for samples. The data was measured under conditions of zero field cooling (ZFC) and field cooling (FC) at . (b) Temperature dependence of the resistivity, , for the sample under different applied fields from 0 to 10 T. Inset: the upper critical filed as a function of temperature.
Calculated Fermi surfaces of with . (a) , (b) . (c) Lattice parameter ratio of as a function of x for ( and Ir). Data for is taken from Ref. 14.
Lattice parameters of the -axis and -axis, onset SC transition and midpoint SC transition temperatures for samples.
Article metrics loading...