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Thin film dielectric microstrip kinetic inductance detectors
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10.1063/1.3314281
/content/aip/journal/apl/96/10/10.1063/1.3314281
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/10/10.1063/1.3314281
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Right: A cross-sectional view of a conventional CPW transmission line and the microstrip transmission lines used in this paper. Left: An optical microscope image of a portion of the tested device. The inset on the lower left shows a SEM image of the cross section of a device that has been cleaved.

Image of FIG. 2.
FIG. 2.

The loss tangent of the a-Si:H dielectric, , dramatically decreases as the electric field in the resonator increases. The electric field shown is the value at the open ends of the half wave resonator tested. This resonator is long, with and a resonant frequency of 9.054 GHz when operated under an optimal magnetic field of 30 mG. It shows a fractional frequency noise (Ref. 17) of at a readout power of −91 dBm (equivalent to a current density of 17.5 A/m).

Image of FIG. 3.
FIG. 3.

The NEP of the microstrip resonator. The solid line shows the NEP derived from phase shifts only, the dotted line is derived from dissipation data, and the dashed line is the optimal NEP using both dissipation and phase data (Ref. 14). The red line is the predicted NEP from Eqs. (3), (5), and (6) assuming there is 2 dB of loss between the device and a HEMT amplifier with .

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/content/aip/journal/apl/96/10/10.1063/1.3314281
2010-03-08
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Thin film dielectric microstrip kinetic inductance detectors
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/10/10.1063/1.3314281
10.1063/1.3314281
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