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SEM picture of the test device. Quasiparticles are electrically injected into the absorber via an SIS junction.
Simplified schematic of the measurement technique. Components within the dashed lines are mounted on the mixing chamber of a dilution refrigerator. Bottom right: Voltage-current characteristics of the SIS junction used for quasiparticle injection.
Lock-in response as a function of number of quasiparticles present in the absorber. Circles represent the experimental data, while the solid line is a linear fit to the response of the QCD. The noise spectral density in the measured number of quasiparticles in the absorber is . The inset shows the response of the lock-in amplifier for different ac amplitudes running through the SIS junction.
Sensitivity of the QCD as a function of the incident electrical power, which simulates the optical loading. (Blue) circles show the experimental data, while the (red) solid line represents the simulated results using a kinetic theory (Refs. 1 and 15). The second plot shows the conversion of the sensitivity of the QCD into NEP for the same measurement.
Predicted NEP of the QCD as a function of the optical loading. The (red) dark solid line represents the performance of the QCD running at 30 mK while the (green) light solid line shows the performance of the QCD with the same parameters but at 100 mK, the optimal operation temperature. Blue circles show our experimental data.
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