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Effects of atomic-scale surface morphology on carbon nanotube alignment on thermally oxidized silicon surface
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10.1063/1.3354009
/content/aip/journal/apl/96/10/10.1063/1.3354009
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/10/10.1063/1.3354009
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Figures

Image of FIG. 1.
FIG. 1.

(a) SEM image and Raman spectra of SWNTs grown on a step-structure-controlled substrate. The boundary of the catalyst-deposited region is perpendicular to the steps. Raman spectra were obtained with 532 nm (bottom) and 785 nm (top) excitation lasers. (b) AFM image of the same substrate and a line profile along the white line in the AFM image.

Image of FIG. 2.
FIG. 2.

SEM image of SWNTs grown on the step-structure-controlled substrate. The boundary of the catalyst-deposited region is parallel to the steps.

Image of FIG. 3.
FIG. 3.

SEM images of SWNTs with CVD periods of (a) 2.5 min and (b) 5 min. (c) Relationship between SWNT orientation and SWNT length.

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/content/aip/journal/apl/96/10/10.1063/1.3354009
2010-03-08
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effects of atomic-scale surface morphology on carbon nanotube alignment on thermally oxidized silicon surface
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/10/10.1063/1.3354009
10.1063/1.3354009
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