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Self-assembled nanoripples on Si(1 1 10) substrates
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10.1063/1.3358132
/content/aip/journal/apl/96/10/10.1063/1.3358132
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/10/10.1063/1.3358132
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Figures

Image of FIG. 1.
FIG. 1.

(a) top-view AFM image, and (b) enlarged 3D rendering of a sample with a coverage of 100 ML. Upper inset in (a) surface angle plot with maxima corresponding to {105} facets; lower inset: Fourier transform (FFT) of the AFM image.

Image of FIG. 2.
FIG. 2.

[(a)–(d)] AFM images for coverages ranging from 30 to 1250 ML; (e) prism width vs coverage; (f) cross-sectional TEM image after deposition of 320 ML .

Image of FIG. 3.
FIG. 3.

[(a) and (b)] XRD reciprocal space maps with azimuths perpendicular (x) and parallel (y) to the prisms for 320 ML coverage. [(c) and (d)] simulated strain distribution corresponding to the strain tensors and . (e) strain distribution profile and surface energy density along the white scale bar in (c).

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/content/aip/journal/apl/96/10/10.1063/1.3358132
2010-03-10
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Self-assembled Si0.80Ge0.20 nanoripples on Si(1 1 10) substrates
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/10/10.1063/1.3358132
10.1063/1.3358132
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