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(a) measured at 10 min. intervals (blue, solid) and after 9 h (red, dotted) of current annealing at (arrow indicates the direction of peak position shift.) After 10 min at (green, dashed.) Inset: False-color atomic force micrograph of the sample (scale bar is .) (b) Schematic of the SGM setup.
(a) Series of raw images captured at different . Inset: device schematic (white outline indicates scan area.) (b) Normalized measured with the tip at the locations marked in the inset of (a). (c) Contour plot of with the flake in the state corresponding to the red (dotted) sweep in Fig. 1(a). Scale bars are .
(a) reconstructed by integrating the sweeps in Fig. 2(b). Each curve has been vertically offset such that . (b) Correlation plots between and . Dashed line indicates the linear trend.
(a) Contour plot of with the flake in the state corresponding to the green (dashed) curve in Fig. 1(a). (b) Raw image together with a line profile of taken along the blue line in the image. Scale bars are .
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