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Inertial measurement with trapped particles: A microdynamical system
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10.1063/1.3360808
/content/aip/journal/apl/96/14/10.1063/1.3360808
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/14/10.1063/1.3360808
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Simulation results for a particle launched into the plane of a trap in free fall (from to ) and then subject to a linearly increasing downward acceleration (along ) from 0 to 1 g (from to ). Data are plotted as (a) position of the particle and applied acceleration over time and (b) projections of particle motion. Simulation parameters are as described in the text. Note that the mean particle displacement is proportional to .

Image of FIG. 2.
FIG. 2.

Trap construction detail. Dimensions referenced in the figure are , .

Image of FIG. 3.
FIG. 3.

Observed particle displacement as a function of applied acceleration (with linear fits).

Image of FIG. 4.
FIG. 4.

Measured effective spring constant as a function of trap voltage.

Image of FIG. 5.
FIG. 5.

Power spectral density of observed particle drift with simulated and diffusion noise spectra overlaid. As the particle passes repeatedly through the Gaussian waist of a focused weak laser beam, its time-domain optical scattering signal reveals the amount of time spent in the beam waist and allows measurement of the particle’s closest approach to the optical axis (calibrated by applying known accelerations.) The large peak is from 60 Hz noise, and the side peaks are associated with resonances of the secular motion in the trap potential (verified by simulating the trap dynamics with stochastic forcing).

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/content/aip/journal/apl/96/14/10.1063/1.3360808
2010-04-05
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Inertial measurement with trapped particles: A microdynamical system
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/14/10.1063/1.3360808
10.1063/1.3360808
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