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SEM cross-sectional images of the compacts before [(a) and (c)] after [(b) and (d)] annealing at : (a) and (b) pure Cu nanoparticle compacts and (c) and (d) Cu–Ag nanoparticle compacts. The arrows in (d) indicate fractured necks which are evidence of significant sintering. Scale bar is .
TEM and EFTEM images of the Cu–Ag particle compact before annealing: (a) TEM image, (b) Ag jump ratio map image of (a) area, (c) Cu elemental map image (a) area, (d) particle surface area at high magnification; Ag layer is indicated by two parallel dashed lines. The scale bar: 500 nm in (c) and 10 nm in (d).
TEM and EFTEM images of the Cu–Ag compact after annealing at : (a) TEM image, (b) Ag ratio map of (a) area, (c) Cu elemental map of (a) area, (d) Ag ratio map of white box area in (a). The scale bar: 300 nm in (c) and 100 nm in (d).
Relative density and grain size comparison between Cu and Cu–Ag particle compact before and after annealing at .
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