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Microstructure of annealed metallic glass. (a) Bright-field TEM micrograph showing a heterogeneous dendrite crystal in an amorphous matrix and (b) high-resolution transmission electron microscope (HRTEM) image taken from the marked frame in (a) showing a dendritic branch embedding into a amorphous matrix. The inset shows zoom-in HRTEM image from the marked region in (b).
Atom probe tomograph of the as-prepared metallic glass, showing homogeneous distribution of all elements.
Atom probe tomograph taken from a dendrite region of the partially crystallized metallic glass. (a) 3D atom maps of all the elements detected in the annealed alloy and (b) concentration profiles of the annealed metallic glass.
Impurity element distributions in the vicinity of an interface between a primary crystal and the remaining amorphous phase. (a) Boron; (b) carbon; and (c) silicon. The contrast of the matrix shows the concentration difference of Pd in crystalline and amorphous phases.
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