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Simulation of x-ray production within the storage ring.
Comparison of x-ray spectra emitted by a standard x-ray tube at 100 kV (continuous curve) and the MIRRORCLE-6X source (dotted curve). The fluence is given in units of photons per MeV per per incident electron.
(Top image) Radiograph of PMMA slab 10-mm-thick. The slab covers the bottom half of the x-ray detector. (Bottom image) The vertical profile shows the edge-enhancement effect.
Schematic of the x-ray interaction within the RadEye2 detector (not to scale).
Edge-enhancement effect: comparison between experimental and simulated data. The experimental data (continuous line) were taken from the radiograph of an Al detail (In the top image the white line represents the line profile used for the comparison). Data from the Monte Carlo simulation (dotted line) are reported with their statistical uncertainty.
Comparison of simulated line profiles obtained with three different x-ray spectra. 1–150 keV (dotted-dashed line), 150 keV–1 MeV (dotted line), and 1–6 MeV (continuous line).
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