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Perpendicularizing magnetic anisotropy of full-Heusler films by cosputtering with terbium
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10.1063/1.3380754
/content/aip/journal/apl/96/14/10.1063/1.3380754
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/14/10.1063/1.3380754
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Magnetization curves for the TCFA films while , 22%, 40%, and 50%, respectively. The magnetic field was aligned in the films plane (dashed lines) or perpendicular to the films plane (solid lines).

Image of FIG. 2.
FIG. 2.

Tb content dependence of Hc (square symbols) and Ms (circle symbols) for the TCFA films with perpendicular anisotropy. The magnetic field was aligned perpendicular to the films. The thickness of the films is 30 nm. The solid lines are to guide the eyes.

Image of FIG. 3.
FIG. 3.

(a) XRD patterns for the TCFA films with Tb content and 40%, respectively. (b) HRTEM image and SAED pattern (inset) for the TCFA film with . The thickness of all the films is 30 nm.

Image of FIG. 4.
FIG. 4.

CPP GMR of the SPV with the TCFA as free and reference layers. The measurement was taken at RT with a magnetic field aligned perpendicular to the films.

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/content/aip/journal/apl/96/14/10.1063/1.3380754
2010-04-07
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Perpendicularizing magnetic anisotropy of full-Heusler Co2FeAl films by cosputtering with terbium
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/14/10.1063/1.3380754
10.1063/1.3380754
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