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X-ray diffraction patterns of (a) NiO/Pt and (b) ZnO/Al and GZO/Al. Insets: Enlarged figures around the (111) peak of NiO and (0002) peaks of ZnO and GZO.
Current images of NiO/Pt (a) before and (b) after twofold overwriting by application of ±7 V.
Current images of ZnO/Al (a) before and (b) after twofold overwriting by application of ±5 V.
(a) Current image of as-deposited GZO/Al and GZO/Al after twofold overwriting by applying (b) ±3 V and (c) ±4 V, respectively. (d) Topographic image of GZO/Al acquired simultaneously with (c).
Schematic illustrations of the composition distribution in HRS for (a) NiO and (b) GZO, respectively. BE indicates the BE. Oxygen ion migration is also indicated.
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