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Establishing the mechanism of thermally induced degradation of ZnO:Al electrical properties using synchrotron radiation
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10.1063/1.3385024
/content/aip/journal/apl/96/14/10.1063/1.3385024
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/14/10.1063/1.3385024
/content/aip/journal/apl/96/14/10.1063/1.3385024
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/content/aip/journal/apl/96/14/10.1063/1.3385024
2010-04-07
2014-11-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Establishing the mechanism of thermally induced degradation of ZnO:Al electrical properties using synchrotron radiation
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/14/10.1063/1.3385024
10.1063/1.3385024
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