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Cross-sectional diagram of a double-channel ridge-waveguide QCL.
Micrographs of the facet catastrophic failure feature for the two lasers. (a) G358 and (b) G085 were driven by electrical power of 13.2 W and 47.85 W, respectively. The repetition frequency for both the lasers is 1 kHz with pulse width. The origin of the OZ axis corresponds to the interface (black bold solid line) between epilayer and substrate. The , , , and represent the estimated locations on the OZ axis of stress relaxation (thin dashed lines). The black bold dashed line separates the damaged lattice and perfect lattice (as marked by A) of epilayer.
Simulated temperature distributions for (a) G358 and (b) G085. The heat flux distribution out from the core structure of the devices is also shown in the panels. The origin of the OZ axis corresponds to the interface between epilayer and substrate.
Front facet temperature distributions along the axis OZ on the substrate sides for (a) G358 and (b) G085. The is the coordinate along OZ axis, while , , , and represent the estimated locations of stress relaxation, as marked by dashed lines. The curves can be fitted precisely by second-order exponential decay function (dashed curves).
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