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SEM micrographs of (a) GaN/sapphire template, (b) GaN film at , (c) roughen GaN layer at , (d) GaN columns at , (e) GaN nanorods at , and (f) roughen GaN layer at . The inset in the (e) shows the GaN nanorods in the top view.
Cross-sectional HRTEM images of the GaN nanorods on the GaN template. The insets show the magnified HRTEM images.
PL spectra of the GaN template and the GaN nanorods at 10 K.
Cross-sectional SEM images and the estimated effective refractive index profiles along the vertical direction for (a) GaN film, (b) GaN columns, and (c) GaN nanorods.
(a) Measured reflectance spectra of GaN film, GaN columns, roughed GaN layer , and GaN nanorods at normal incidence, and (b) measured reflectance spectra of the GaN nanorods at different incident angles. The inset of (b) shows the values for the various GaN structures.
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