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Time dependence of the interface roughness of TiC/a-C films: (a) the influence of the noise strength and (b) the effect of the diffusion coefficient responsible for the downhill flow of adatoms induced by the concurrent ions impingement. The model curves are found from the solution of Eqs. (1)–(3). The black curve of round symbols is the experimental result.
Numerically simulated interface profiles vs deposition time , with the interfaces roughness indicated: (a) profiles simulated with the basic set of parameters to fit the experimental result plotted in Fig. 1; (b) with high deposition noise; (c) with no diffusion; (d) with high value of diffusivity; (e) with no diffusion, and (f) with high value of diffusivity. For clarity, each profile is shifted along z-axis by 2 nm.
Cross-sectional HRTEM micrograph of the film revealing that an amorphous front layer of about 2 nm thickness covers the bulk nanocomposite film. The inset is an overview of the growing interface.
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