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Ultimate quality factor of silica microtoroid resonant cavities
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1.
1.J. G. Zhu, S. K. Ozdemir, Y. F. Xiao, L. Li, L. N. He, D. R. Chen, and L. Yang, Nat. Photonics 4, 46 (2010).
http://dx.doi.org/10.1038/nphoton.2009.237
2.
2.A. M. Armani, R. P. Kulkarni, S. E. Fraser, R. C. Flagan, and K. J. Vahala, Science 317, 783 (2007).
http://dx.doi.org/10.1126/science.1145002
3.
3.H. -S. Choi, X. Zhang, and A. M. Armani, Opt. Lett. 35, 459 (2010).
http://dx.doi.org/10.1364/OL.35.000459
4.
4.G. Anetsberger, R. Riviere, A. Schliesser, O. Arcizet, and T. J. Kippenberg, Nat. Photonics 2, 627 (2008).
http://dx.doi.org/10.1038/nphoton.2008.199
5.
5.H. Rokhsari and K. J. Vahala, Phys. Rev. Lett. 92, 253905 (2004).
http://dx.doi.org/10.1103/PhysRevLett.92.253905
6.
6.M. L. Gorodetsky, A. A. Savchenkov, and V. S. Ilchenko, Opt. Lett. 21, 453 (1996).
http://dx.doi.org/10.1364/OL.21.000453
7.
7.D. W. Vernooy, V. S. Ilchenko, H. Mabuchi, E. W. Streed, and H. J. Kimble, Opt. Lett. 23, 247 (1998).
http://dx.doi.org/10.1364/OL.23.000247
8.
8.M. L. Gorodetsky, A. D. Pryamikov, and V. S. Ilchenko, J. Opt. Soc. Am. B 17, 1051 (2000).
http://dx.doi.org/10.1364/JOSAB.17.001051
9.
9.J. C. Knight, G. Cheung, F. Jacques, and T. A. Birks, Opt. Lett. 22, 1129 (1997).
http://dx.doi.org/10.1364/OL.22.001129
10.
10.G. M. Hale and M. R. Querry, Appl. Opt. 12, 555 (1973).
http://dx.doi.org/10.1364/AO.12.000555
11.
11.D. K. Armani, T. J. Kippenberg, S. M. Spillane, and K. J. Vahala, Nature (London) 421, 925 (2003).
http://dx.doi.org/10.1038/nature01371
12.
12.B. G. Streetman and S. Banerjee, Solid State Electronic Devices, 6th ed. (Prentice Hall, Englewood Cliffs, NJ, 2005).
13.
13.R. B. Fair, J. Electrochem. Soc. 144, 708 (1997).
http://dx.doi.org/10.1149/1.1837473
14.
14.P. G. Snyder, M. C. Rost, G. H. Bu-Abbud, J. A. Woollam, and S. A. Alterovitz, J. Appl. Phys. 60, 3293 (1986).
http://dx.doi.org/10.1063/1.337695
15.
15.S. M. Spillane, T. J. Kippenberg, O. J. Painter, and K. J. Vahala, Phys. Rev. Lett. 91, 043902 (2003).
http://dx.doi.org/10.1103/PhysRevLett.91.043902
16.
16.D. S. Weiss, V. Sandoghbar, J. Hare, V. Lefevre-Seguin, J. -M. Raimond, and S. Haroche, Opt. Lett. 20, 1835 (1995).
http://dx.doi.org/10.1364/OL.20.001835
17.
17.T. J. Kippenberg, S. M. Spillane, and K. J. Vahala, Opt. Lett. 27, 1669 (2002).
http://dx.doi.org/10.1364/OL.27.001669
18.
18.H. -S. Hsu, C. Cai, and A. M. Armani, Opt. Express 17, 23265 (2009).
http://dx.doi.org/10.1364/OE.17.023265
19.
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/content/aip/journal/apl/96/15/10.1063/1.3398008
2010-04-15
2014-07-24

Abstract

Silica optical microcavities with quality (Q factors above have applications throughout science and engineering. While both the microtoroid and microsphere resonantcavity have demonstrated , only the microsphere has surpassed . Surprisingly, the reason for this performance disparity is directly related to type of silicon substrate used in the fabrication process. In the present work, the theoretical Q of planar toroidal silicaresonantcavities is calculated and compared to experimental results from a series of devices fabricated from oxide on dopedsilicon wafers. As predicted, the Q depends on the substrate dopant concentration.

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Scitation: Ultimate quality factor of silica microtoroid resonant cavities
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/15/10.1063/1.3398008
10.1063/1.3398008
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