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Giant dielectric constant dominated by Maxwell–Wagner relaxation in nanolaminates synthesized by atomic layer deposition
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10.1063/1.3413961
/content/aip/journal/apl/96/16/10.1063/1.3413961
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/16/10.1063/1.3413961
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Figures

Image of FIG. 1.
FIG. 1.

(a) Ti-map calculated from energy-filtered transmission electron microscopy images. (b) Bright-field transmission electron microscopy image. (c) Line scans calculated from elemental maps of Ti, Al, and O, respectively, in nanolaminates.

Image of FIG. 2.
FIG. 2.

Dielectric constant (a) and dielectric loss (b) as a function of frequency of nanolaminates with various sublayer thicknesses.

Image of FIG. 3.
FIG. 3.

Dielectric constant (a), dielectric loss (b), imaginary part of impedance (c), imaginary part of electric modulus (d), and ac conductivity (e) as a function of frequency at various temperatures for nanolaminate with sublayer thicknesses of 0.5 nm. The inset of (d) shows the enlarged part of the dashed rectangle area.

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/content/aip/journal/apl/96/16/10.1063/1.3413961
2010-04-23
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Giant dielectric constant dominated by Maxwell–Wagner relaxation in Al2O3/TiO2 nanolaminates synthesized by atomic layer deposition
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/16/10.1063/1.3413961
10.1063/1.3413961
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