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Characterization of polycrystals with elongated duplex microstructure by inversion of ultrasonic backscattering data
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10.1063/1.3416910
/content/aip/journal/apl/96/16/10.1063/1.3416910
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/16/10.1063/1.3416910
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

The directional ratios of the square roots of backscattering coefficients vs frequency for the duplex structure [Eq. (4)] at ; dashed lines are the same without the crystallite contributions ; , and , .

Image of FIG. 2.
FIG. 2.

The experimental backscattering directional ratios (solid lines) vs frequency for Ti alloy sample. The dashed lines are calculated with the model, Eq. (4), using the inverted parameters .

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/content/aip/journal/apl/96/16/10.1063/1.3416910
2010-04-23
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of polycrystals with elongated duplex microstructure by inversion of ultrasonic backscattering data
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/16/10.1063/1.3416910
10.1063/1.3416910
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