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Electrical transport in small bundles of single-walled carbon nanotubes: Intertube interaction and effects of tube deformation
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10.1063/1.3402768
/content/aip/journal/apl/96/17/10.1063/1.3402768
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/17/10.1063/1.3402768
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Scanning electron microscopy image of a SWNT bundle in the FET, enlarged view from the circled area in the inset. Inset shows a large view of the device array fabricated on a silicon-on-insulator wafer.

Image of FIG. 2.
FIG. 2.

Current-voltage characteristics of two-tube bundles. (a) Current modulation is superimposed onto the metallic contribution from device I. The inset shows two tubes are separated at the source contact. (b) characteristics obtained from device II. The dotted arrow in the inset represents the direction of the electric field during device operation. The two SWNTs are almost vertically stacked with respect to the electric field. All the measurements were performed at 0.5 V of source-drain voltage.

Image of FIG. 3.
FIG. 3.

(a) DPs from experiment (left) and simulation (right). Both diffraction spots and equatorial oscillation match well. (b) Comparison of intensity profiles of the equatorial lines obtained from experiment and simulation. The best match was found with .

Image of FIG. 4.
FIG. 4.

(a) Band structure of a small bundle consisting of (26,0)-(21,0) CNTs. The inset shows the band gap opening of the (21,0) CNT. The band gap of (21,0) becomes 18 meV, The original band gap of this CNT is 7 meV. Because of the vdW interaction, the CNTs are deformed. (b) A model structure used in the calculation is shown. The model includes radial deformation for the calculation.

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/content/aip/journal/apl/96/17/10.1063/1.3402768
2010-04-28
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electrical transport in small bundles of single-walled carbon nanotubes: Intertube interaction and effects of tube deformation
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/17/10.1063/1.3402768
10.1063/1.3402768
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