Full text loading...
(a) Atomic force microscopy (AFM) image of the stamped porous silicon grating. (b) Cross section of the AFM profile of the porous silicon grating revealing a 29 nm grating height.
(a) Schematic of the PSi-DBB geometry. (b) Picture of the detection apparatus showing visible diffraction from a porous grating with a 60 nm grating height.
Camera images of diffraction before and after exposing the PSi-DBB to water vapor. Before exposure, the back diffracted beams and are too weak to be observed by the digital camera. After exposure, a large increase in diffraction efficiency is observed.
Change to diffraction efficiency of the PSi-DBB during exposure to 0.25% solution of 3-APTES for grating of height , period , and air fraction . The responses are fitted with the single exponential function.
Article metrics loading...