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High angle x-ray diffraction spectra of (a) directly grown on MgO(100) substrate and of (b) buffer layer of 12 nm on MgO(100) and (c) samples. (d) -scans of the (202) reflections of BFO and MgO for .
(a) In-plane piezoresponse phase image of as grown ferroelectrics domains measured using a CrPt coated conducting tip. (b) and (c) are, respectively, I(V) and P(E) loops measured on square capacitor.
Spectroscopy transmission spectra for BFO films (a) on STO substrates and (b) on STO-buffered MgO. The insets compare the experimental data and the modeling of multilayer heterostructures: (a) and (b) , using the BFO dispersion law determined with the ellipsometry study.
(a) Compared experimental and modeled vs energy plots for and samples. (b) Dispersion law for BFO films, with the parameters for the three Tauc–Lorentz oscillators.
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