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Terahertz electroluminescence of surface plasmons from nanostructured InN layers
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10.1063/1.3425897
/content/aip/journal/apl/96/18/10.1063/1.3425897
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/18/10.1063/1.3425897
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Figures

Image of FIG. 1.
FIG. 1.

[(a)–(c)] SEM images of three representative samples A (, , ), B (, , ), and C (, , ); (d), (e), and (f) present, respectively, the distributions of distance between imperfections in these samples.

Image of FIG. 2.
FIG. 2.

(a) Spectrum of THz radiation measured in a sample with the grating period , (b) plasmon frequency dispersion calculated for an interior layer with , , , and . The value is taken two times higher than the Hall concentration in this sample; for an accumulation layer.

Image of FIG. 3.
FIG. 3.

The dependences of the THz radiation power collected in the 3–5 THz range on applied electric power measured in: thick InN sample A; thick -GaN layer (Ref. 16); -doped structure with GaAs/AlGaAs quantum wells (Ref. 17).

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/content/aip/journal/apl/96/18/10.1063/1.3425897
2010-05-05
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Terahertz electroluminescence of surface plasmons from nanostructured InN layers
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/18/10.1063/1.3425897
10.1063/1.3425897
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