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Investigation of phonon-plasmon coupled modes and critical points in thin films by optical reflectance measurements
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10.1063/1.3428368
/content/aip/journal/apl/96/18/10.1063/1.3428368
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/18/10.1063/1.3428368
/content/aip/journal/apl/96/18/10.1063/1.3428368
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/content/aip/journal/apl/96/18/10.1063/1.3428368
2010-05-06
2014-10-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Investigation of E1(LO) phonon-plasmon coupled modes and critical points in In1−xGaxN thin films by optical reflectance measurements
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/18/10.1063/1.3428368
10.1063/1.3428368
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