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Investigation of phonon-plasmon coupled modes and critical points in thin films by optical reflectance measurements
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10.1063/1.3428368
/content/aip/journal/apl/96/18/10.1063/1.3428368
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/18/10.1063/1.3428368

Figures

Image of FIG. 1.
FIG. 1.

IR reflectance spectra of (, 0.15, 0.30, and 0.54) thin films under normal incidence. The dashed curves show the theoretical reflectance.

Image of FIG. 2.
FIG. 2.

Variation in the energy of coupled modes and with . The energies of the coupled modes and plasmon for InN film and are shown by the filled circles. Two straight lines in each panel represent the energies of and for the corresponding film. Inset shows variation in the broadening parameters, , , and , with .

Image of FIG. 3.
FIG. 3.

(a) UV reflectance from films showing the critical point transitions (shown by arrows) and (b) variation in critical point energies of alloy as a function of . The solid lines show the fitted data.

Tables

Generic image for table
Table I.

Electronic and optical properties of thin films for different values of .

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/content/aip/journal/apl/96/18/10.1063/1.3428368
2010-05-06
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Investigation of E1(LO) phonon-plasmon coupled modes and critical points in In1−xGaxN thin films by optical reflectance measurements
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/18/10.1063/1.3428368
10.1063/1.3428368
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