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Evolution of locally excited avalanches in semiconductors
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10.1063/1.3425737
/content/aip/journal/apl/96/19/10.1063/1.3425737
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/19/10.1063/1.3425737
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Optical setup; (b) Photocurrent as a function of position of the stage measured under low-gain operation mode; (c) The photocurrent derivative as a function of the -stage position; (d) An avalanche trace recorded by an oscilloscope; and (e) A temporal current distribution under a saturation delay.

Image of FIG. 2.
FIG. 2.

(a) Two-dimensional (2D) plot showing the current distribution as a function of time for a detected flux of 0.05 photons/pulse; (b) A temporal current distribution at a time delay of 340 ps; (c) The noise factor for the 1-photon avalanche as a function of time.

Image of FIG. 3.
FIG. 3.

2D plot showing the current distribution as a function of time for a detected flux of 2.14 photons/pulse.

Image of FIG. 4.
FIG. 4.

Current distributions at various delays for a detected flux of 2.14. The vertical axes in (e-h) are scaled up by a factor of 6.4 for clarity.

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/content/aip/journal/apl/96/19/10.1063/1.3425737
2010-05-13
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Evolution of locally excited avalanches in semiconductors
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/19/10.1063/1.3425737
10.1063/1.3425737
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