1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
A study on the temperature dependence of the threshold switching characteristics of
Rent:
Rent this article for
USD
10.1063/1.3275756
/content/aip/journal/apl/96/2/10.1063/1.3275756
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/2/10.1063/1.3275756
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Pulse-mode curves of a representative device at various . The definition of is denoted. (b) The -dependence of of devices. The error bars were obtained from three time repetitions of three devices with the same device structure. The solid line is a linear fit to the data.

Image of FIG. 2.
FIG. 2.

Delay time of a representative device as a function of the bias voltage at . and are defined as those shown in the upper inset of the figure due to the -delay of the device. The solid line is the fitting curve by Eq. (5). Lower inset: A schematic illustration of the carrier hopping transport in a chalcogenide material, leading to the expression of in Eq. (5).

Image of FIG. 3.
FIG. 3.

(a) Delay time of a representative device as a function of at various . The solid lines are fitting curves at each using Eq. (5). (b) -dependence of , calculated from the fitting to the data in Fig. 3(a) using Eq. (5). Note that the slope (−2.8 mV/K) is same as that obtained by direct pulse-mode curves.

Loading

Article metrics loading...

/content/aip/journal/apl/96/2/10.1063/1.3275756
2010-01-12
2014-04-24
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: A study on the temperature dependence of the threshold switching characteristics of Ge2Sb2Te5
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/2/10.1063/1.3275756
10.1063/1.3275756
SEARCH_EXPAND_ITEM