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(a) Scanning electron micrographs of a porous silicon layer on a doped silicon substrate. The enlarged micrographs show the nanoscale structure of the porous skeleton. (b) Diagram showing aperture coupling technique used to couple THz radiation into and out of the surface plasmon waveguide.
Calculated transverse magnetic field profiles for the surface plasmon modes of a nanoporous silicon waveguide. The lowest curve shows the surface plasmon mode of a silicon wafer with no porous layer, and the upper three curves correspond to waveguides with porous layers with thickness 10.6, 28.3, and . All modes were calculated at a frequency of 1 THz, and normalized to have the same total power.
(a) Calculated effective index and (b) attenuation factor as a function of frequency. (c) Calculated group delay and (d) amplitude transmission spectrum for a 12.5 mm long waveguide. In each case, the four curves shown correspond to porous layer thicknesses of 0, 10.6, 28.3, and .
Comparison of measured (left) and calculated (right) time domain traces for the four different surface plasmon waveguides considered here.
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