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Dispersion measurements of a quantum dot semiconductor optical amplifier over 120 nm of spectral bandwidth
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10.1063/1.3430742
/content/aip/journal/apl/96/21/10.1063/1.3430742
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/21/10.1063/1.3430742
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Mach–Zehnder style, spectral interferometer experimental setup; SOA, semiconductor optical amplifier; DUT, device under test; BS, beam splitter; L, coupling lens; M, mirror; VOD, variable optical delay; and OSA, optical spectrum analyzer.

Image of FIG. 2.
FIG. 2.

Spectral interferogram. Group delay is obtained by determining the change in fringe spacing across the spectrum.

Image of FIG. 3.
FIG. 3.

WT of spectral interferogram. The maximum at each wavelength value corresponds to the group delay.

Image of FIG. 4.
FIG. 4.

QD SOA spectral density at measured injection currents.

Image of FIG. 5.
FIG. 5.

Group delay at measured injection currents.

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/content/aip/journal/apl/96/21/10.1063/1.3430742
2010-05-27
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Dispersion measurements of a 1.3 μm quantum dot semiconductor optical amplifier over 120 nm of spectral bandwidth
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/21/10.1063/1.3430742
10.1063/1.3430742
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