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Nanoscale imaging and control of resistance switching in at room temperature
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10.1063/1.3435466
/content/aip/journal/apl/96/21/10.1063/1.3435466
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/21/10.1063/1.3435466
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Figures

Image of FIG. 1.
FIG. 1.

(a) XRD profile, performed on a Scintag XDS2000 diffractometer using radiation at incidence angle of 1°. The observed peaks correspond to the monoclinic phase and demonstrate polycrystallinity (Ref. 16 ). (b) The RR is as a function of temperature, measured in two-point geometry as shown in the inset. For this data, voltage was applied and current was measured between two neighboring Pd contact pads, centered 1 mm apart. Varying the distance between Pd pads did not alter the resistance, demonstrating that the resistance is entirely vertical through the film, with negligible contribution from the doped Si substrate or the interface.

Image of FIG. 2.
FIG. 2.

(a) Schematic of the microscope tip and sample geometry. (b) Height trace from AFM topography demonstrates the tip resolution and surface roughness. (c) 14 consecutive sweeps at a single location at . [(d) and (e)] 200 consecutive sweeps at two different representative locations, at room temperature. Iterations start from black and run through grey (light blue online). Training voltage is in (d) and (e) and in (c). [(f) and (g)] as a function of iteration number for the data from (d) and (e).

Image of FIG. 3.
FIG. 3.

(a) AFM topography of the surface. [(b)–(f)] Current maps at increasing bias voltage show the metallic puddle seeded at two grains (outlined in black), growing with increasing bias. Grain boundaries are drawn in white in the upper right corners of (a) and (b), which were acquired simultaneously, to emphasize the correlation between grain locations and regions of constant current. (g) Current distributions for (b)–(f) are bimodal, showing the jump between insulating and metallic state conductivity. A second set of images (not shown), acquired in this same area, as the applied voltage was subsequently decreased by the same increments, show the shrinking and disappearance of the metallic puddle.

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/content/aip/journal/apl/96/21/10.1063/1.3435466
2010-05-25
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nanoscale imaging and control of resistance switching in VO2 at room temperature
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/21/10.1063/1.3435466
10.1063/1.3435466
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