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Current-induced degradation of high performance deep ultraviolet light emitting diodes
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10.1063/1.3435485
/content/aip/journal/apl/96/21/10.1063/1.3435485
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/21/10.1063/1.3435485
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Electroluminescence spectra of LEDs thermally (left) and electrically (right) stressed over time. The device under electrical bias continued to degrade beyond that of the device held at the equivalent operating temperature.

Image of FIG. 2.
FIG. 2.

EQE curves of an unstressed, thermally stressed, and electrically stressed device, for 75 mA (a) and 20 mA (b).

Image of FIG. 3.
FIG. 3.

TRPL curves monitoring the active region of a device before and after being placed under 75 mA forward bias for 44 h, with the former offset as shown for clarity.

Image of FIG. 4.
FIG. 4.

Apparent charge profile of an unstressed and electrically stressed device calculated from capacitance-voltage measurements, as a function of depletion width.

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/content/aip/journal/apl/96/21/10.1063/1.3435485
2010-05-27
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Current-induced degradation of high performance deep ultraviolet light emitting diodes
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/21/10.1063/1.3435485
10.1063/1.3435485
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