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Electroluminescence spectra of LEDs thermally (left) and electrically (right) stressed over time. The device under electrical bias continued to degrade beyond that of the device held at the equivalent operating temperature.
EQE curves of an unstressed, thermally stressed, and electrically stressed device, for 75 mA (a) and 20 mA (b).
TRPL curves monitoring the active region of a device before and after being placed under 75 mA forward bias for 44 h, with the former offset as shown for clarity.
Apparent charge profile of an unstressed and electrically stressed device calculated from capacitance-voltage measurements, as a function of depletion width.
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