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(a) A schematic illustration of the nanowires and measurement setup. (b) A transmission electron microscopy image showing the contact between the sample and a probe. The insets show the side view (upper) and the cross section (lower) of the core/shell structure. Thicker ZnO coating was used in the measurements. (c) A typical I-V curve showing both the NDR and RS features.
I-V plots at various scan rates. With a larger scan rate, the diode was turned on at a larger bias when scan from “−” to “” (denoted “n”) and a larger NDR peak appeared in the reverse “p” scan. Inset: semilog scale plot.
(a) NDR peak diminishes at slow scan rate of 2 mV/s. [(b) and (c)] Comparison of I-V plots with or without ZnO.
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