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(a) scans for a selected TMO (38 nm, 0.3 mbar) sample indicating (001) texture with no traces of other contributions. (b) -scan around the STO(111) and TMO(111) reflections evidencing the epitaxial order in o-TMO films. Reciprocal space maps around the (c) TMO(208) and (d) TMO(028) reflections.
Inverse susceptibility measured at different magnetic fields for a selected TMO sample (140 nm thick, 0.3 mbar).
ZFC-FC curves for three TMO samples of the labeled unit cell volume are shown in panels (a)–(c). Samples were grown at 0.1 mbar, 0.2 mbar, and 0.3 mbar with thicknesses 41 nm, 41 nm, and 38 nm, respectively. (d) FC curves for the complete set of samples. All measurements have been performed at 500 Oe applied in-plane of the sample.
Susceptibility at 25 K vs unit cell volume for YMO and TMO thin films. Both compounds display the same trend despite the different bulk magnetic ground structure. Arrows signal the bulk unit cell volumes.
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