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Fe diffusion in polycrystalline layers for thin-film solar cells
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10.1063/1.3449125
/content/aip/journal/apl/96/24/10.1063/1.3449125
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/24/10.1063/1.3449125
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

radiotracer depth profiles in CIGSe resulting from two different diffusion treatments, as indicated. The upper and lower solid lines represent fits with a Gaussian- and erfc-type function, respectively (see text).

Image of FIG. 2.
FIG. 2.

SIMS profiles in CIGSe after Fe diffusion at various temperatures and for different times: (a) , 60 min; (b) , 60 min; (c) , 20 min; (d) , 5 min; (e) , 5 min; (f) , 10 min; and (g) , 5 min.

Image of FIG. 3.
FIG. 3.

Fe surface concentrations (: triangles) and Fe background concentrations (: circles) in CIGSe as taken from Fig. 2 after SIMS calibration. The solid line is a fit of the data resulting in a -independent term (fine-dashed line) and an Arrhenius term (coarse-dashed line); see text.

Image of FIG. 4.
FIG. 4.

Fe diffusion coefficients in CIGSe resulting from SIMS and radiotracer depth profiling, as indicated. The fitted solid line is given by Eq. (1).

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/content/aip/journal/apl/96/24/10.1063/1.3449125
2010-06-14
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Fe diffusion in polycrystalline Cu(In,Ga)Se2 layers for thin-film solar cells
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/24/10.1063/1.3449125
10.1063/1.3449125
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