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radiotracer depth profiles in CIGSe resulting from two different diffusion treatments, as indicated. The upper and lower solid lines represent fits with a Gaussian- and erfc-type function, respectively (see text).
SIMS profiles in CIGSe after Fe diffusion at various temperatures and for different times: (a) , 60 min; (b) , 60 min; (c) , 20 min; (d) , 5 min; (e) , 5 min; (f) , 10 min; and (g) , 5 min.
Fe surface concentrations (: triangles) and Fe background concentrations (: circles) in CIGSe as taken from Fig. 2 after SIMS calibration. The solid line is a fit of the data resulting in a -independent term (fine-dashed line) and an Arrhenius term (coarse-dashed line); see text.
Fe diffusion coefficients in CIGSe resulting from SIMS and radiotracer depth profiling, as indicated. The fitted solid line is given by Eq. (1).
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