Full text loading...
Schematic diagram of the test system.
SEM images of the setup and experimental results of a individual ZnO NW: (a) SEM image of a ZnO NW before failure. (b) I-V curve of the single ZnO NW before its destruction. This curve is fitted very well by the Eq. (1) (c) SEM images of the broken ZnO NW, insert: the high magnification image. (d) The I-V curve recorded during the failure process. When failure took place, the ZnO NW disconnected form the middle and the current dropped. (e) The variation in current with time. (f) Relation between break voltage and morphology of ZnO NWs.
Structural transformation. (a) The morphology and (b) the HRTEM image of the original ZnO NW, with the SAED pattern in insert. (c) The damaged ZnO NW. The HRTEM image of (d) the pearl with diffraction ring shown in SAED image, (e) the chain with a single crystalling diffraction pattern, and (f) the transition part.
The proliferation of electron-hole pairs caused by collision and ionization.
Article metrics loading...