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(a) XRD, (b) 45° titlted top-view SEM, and (c) HRTEM/FFT of NRAs grown on Si substrates at typical preparation conditions. (30 ml aqueous solution containing 10 ml 37 wt % HCl and 0.3 ml TTIP at for 12 h).
SEM images of samples on Si substrates (coated with thin layer) hydrothermal prepared in 30 ml aqueous solution containing 10 ml 37 wt % HCl and 0.3 ml TTIP at (a) for 13 h and (b) for 18 h, respectively.
45° tilted SEM images of (a) Si pillars, (b) NRAs grown on Si pillars, and (c) FTO-covered glass, respectively. (d) characteristics of the DSSC assembled with NRAs grown on FTO-covered glass, being used as photoanode.
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