1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Atomic force microscopy to detect internal live processes in insects
Rent:
Rent this article for
USD
10.1063/1.3273371
/content/aip/journal/apl/96/4/10.1063/1.3273371
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/4/10.1063/1.3273371
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

A scheme of the experimental setup. (a) The special insect holder to restrict motion of the insect during the AFM study. (b) An AFM probe put in contact with an insect surface at an optically chosen place, and the deflection signal from of the AFM cantilever was recorded. Data from a microphone placed near the insect is used for the analysis of external noise.

Image of FIG. 2.
FIG. 2.

(a) Oscillations of the surface collected at the beetle elytra. Zoomed area demonstrates signal of higher frequencies and smaller amplitudes. (b) The signals of (a) filtered with 5 Hz highpass filter (enhanced online).

Image of FIG. 3.
FIG. 3.

Representative spectra of vibrations of elytra of a lady beetle: (a) live beetle (curve 1), the reference spectrum of a dead beetle (curve 2), thermal noise of a cantilever (curve 3); (b) room noise recorded with a microphone. (c) Dead beetle (curve 1), a beetle pushed with the frequency of 0.7 Hz and amplitude of 10 um (curve 2), noise of the working piezo-scanner (curve 3). Insert: a dead lady beetle is pushed through its abdominal segments using a piezo-scanner to mimic breathing/heart beatinglike motion. Curve (3) was multiplied by a factor of 5 for better visibility. The shown spectra were averaged over a 100 s interval.

Loading

Article metrics loading...

/content/aip/journal/apl/96/4/10.1063/1.3273371
2010-01-27
2014-04-17
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Atomic force microscopy to detect internal live processes in insects
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/4/10.1063/1.3273371
10.1063/1.3273371
SEARCH_EXPAND_ITEM