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Atomic force microscopy to detect internal live processes in insects
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View: Figures


Image of FIG. 1.
FIG. 1.

A scheme of the experimental setup. (a) The special insect holder to restrict motion of the insect during the AFM study. (b) An AFM probe put in contact with an insect surface at an optically chosen place, and the deflection signal from of the AFM cantilever was recorded. Data from a microphone placed near the insect is used for the analysis of external noise.

Image of FIG. 2.
FIG. 2.

(a) Oscillations of the surface collected at the beetle elytra. Zoomed area demonstrates signal of higher frequencies and smaller amplitudes. (b) The signals of (a) filtered with 5 Hz highpass filter (enhanced online).

Image of FIG. 3.
FIG. 3.

Representative spectra of vibrations of elytra of a lady beetle: (a) live beetle (curve 1), the reference spectrum of a dead beetle (curve 2), thermal noise of a cantilever (curve 3); (b) room noise recorded with a microphone. (c) Dead beetle (curve 1), a beetle pushed with the frequency of 0.7 Hz and amplitude of 10 um (curve 2), noise of the working piezo-scanner (curve 3). Insert: a dead lady beetle is pushed through its abdominal segments using a piezo-scanner to mimic breathing/heart beatinglike motion. Curve (3) was multiplied by a factor of 5 for better visibility. The shown spectra were averaged over a 100 s interval.


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Scitation: Atomic force microscopy to detect internal live processes in insects