Full text loading...
Mapping near-fields of the nanowire array. Schematic diagram of experimental configuration. The near-field intensity distributions of double-periodic nanowire arrays were directly measured under monochromatic plane wave illumination, using a scanning near-field optical microscope (SNOM). The - and -axis indicate the polarization direction of the incident light. Aluminum nanowires were etched on a silica substrate with a unit cell.
SNOM mapping of a double-periodic nanowire fish-scale array at different wavelengths and polarization. (a) The scanning electron microscope (SEM) image of the nanostructure; (c) the sample topography taken simultaneously with the optical images. The second and third rows show the near-field intensity maps for excitation polarized along and perpendicular to the nanowire meander. Columns correspond to measurements at 550, 660, and 850 nm (from left to right). The bottom row shows field intensity profiles at the position indicated at the -polarization maps. All maps are . (b) The simulated near-field intensity distribution corresponding to the SNOM mapping at the wavelength of 660 nm [plate (e)].
Far-field optical transmission spectra of double-periodic nanowire arrays. The dashed lines indicate the wavelengths used for SNOM mapping of 550, 660, and 850 nm.
Article metrics loading...