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Defects analysis at the nanometric scale in thin films
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10.1063/1.3292590
/content/aip/journal/apl/96/4/10.1063/1.3292590
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/4/10.1063/1.3292590
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD pattern of a 50 nm thick thin film grown on .

Image of FIG. 2.
FIG. 2.

Bright (a) and dark (b) field high resolution TEM images of a 50 nm thick thin film grown on . Co (c) and Ca (d) elemental mapping obtained by analyzing the K lines of Co and Ca of the EDS spectra recorded in each point of the image. The image was scanned ten times which gives the variable color contrast in the Ca and Co mapping. (1) and (2) indicate regions corresponding to the and spurious phase, respectively.

Image of FIG. 3.
FIG. 3.

Variation in the concentration profile of cobalt and calcium across the interface between the [region (1)] and the spurious [region (2)] phases. The inset shows the line profile along which the Co and Ca concentration were analyzed.

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/content/aip/journal/apl/96/4/10.1063/1.3292590
2010-01-25
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Defects analysis at the nanometric scale in Ca3Co4O9 thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/4/10.1063/1.3292590
10.1063/1.3292590
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