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XRD pattern of a 50 nm thick thin film grown on .
Bright (a) and dark (b) field high resolution TEM images of a 50 nm thick thin film grown on . Co (c) and Ca (d) elemental mapping obtained by analyzing the K lines of Co and Ca of the EDS spectra recorded in each point of the image. The image was scanned ten times which gives the variable color contrast in the Ca and Co mapping. (1) and (2) indicate regions corresponding to the and spurious phase, respectively.
Variation in the concentration profile of cobalt and calcium across the interface between the [region (1)] and the spurious [region (2)] phases. The inset shows the line profile along which the Co and Ca concentration were analyzed.
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