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SEM view (45°) of: (a) The high-aspect ratio Si microspike array, (b) high-aspect ratio emitters (HSi sample) (, 500 pulses at the rate 1 kHz, 500 Torr ) (c) higher magnification image of (b), (d) image of an emitter tip showing the decorating CNWs, (e) low-aspect ratio emitters (LSi sample) (, 500 pulses at the repetition rate of 1 kHz, 500 Torr ).
(a) Plot of J-E FE characteristics for the samples studied. The solid lines are guides to the eye. The corresponding FN [ vs ] plots are shown in the inset. The solid lines represent linear fits to the FN equation. (b) Emission current stability over time for the HSi sample. (c) Geometry of a emitter, assumed by the TSFE model.
Morphological characteristics and FE properties of the planar and emitters. The ± values denote the standard deviation of each measured or estimated quantity.
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