Full text loading...
(a) Schematic illustration of the fabrication process. [(b) and (c)] SEM images of buckling profile of the Au/Pd thin films on PDMS substrates, (c) AFM image.
Schematic experimental setup for the stretchable diffraction grating measurement.
The diffraction properties of buckled Au/Pd films: (a) the measured intensities of the first order diffraction show the light wavelength shift of 85 nm assuming the detector is fixed; (b) the peak wavelength of the diffraction light (left axis) increases linearly with the applied strain while the intensity (right axis) decreases while stretching the grating. (c) The peak wavelength of the diffraction light of buckled ITO film increases linearly with the applied strain.
Article metrics loading...