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Measurement of the hot electron attenuation length of copper
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10.1063/1.3299712
/content/aip/journal/apl/96/6/10.1063/1.3299712
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/6/10.1063/1.3299712
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Multiple BEEM spectra obtained from a Cu/Si(001) Schottky diode with a tunneling current of 1.0 nA, a temperature of 80 K, and Cu thickness as indicated. The line represents a fit to the 5 nm sample using . The average SBH occurs at . (Inset) Wiring schematic of the BEEM experiment.

Image of FIG. 2.
FIG. 2.

Normalized BEEM current as a function of Cu thickness for a tip biases of 1.0 and 1.5 eV, with their respective attenuation lengths. The solid lines are a fit to a linearization of Eq. (2), [i.e., ] and have a standard deviation of ±2.9 nm and of 2.79 and 9.25, respectively.

Image of FIG. 3.
FIG. 3.

Dependence of the measured attenuation length with tip bias. The line is a fit to a FLT model described in Eq. (3) with , . The right axis is a nonlinear scale of the extracted inelastic lengths calculated using .

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/content/aip/journal/apl/96/6/10.1063/1.3299712
2010-02-09
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Measurement of the hot electron attenuation length of copper
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/6/10.1063/1.3299712
10.1063/1.3299712
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