Full text loading...
Multiple BEEM spectra obtained from a Cu/Si(001) Schottky diode with a tunneling current of 1.0 nA, a temperature of 80 K, and Cu thickness as indicated. The line represents a fit to the 5 nm sample using . The average SBH occurs at . (Inset) Wiring schematic of the BEEM experiment.
Normalized BEEM current as a function of Cu thickness for a tip biases of 1.0 and 1.5 eV, with their respective attenuation lengths. The solid lines are a fit to a linearization of Eq. (2), [i.e., ] and have a standard deviation of ±2.9 nm and of 2.79 and 9.25, respectively.
Dependence of the measured attenuation length with tip bias. The line is a fit to a FLT model described in Eq. (3) with , . The right axis is a nonlinear scale of the extracted inelastic lengths calculated using .
Article metrics loading...