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XRD patterns of PLZT 8/65/35 and 0/52/48 films deposited on (111) substrates prepared under different annealing conditions. Insets represent the x-ray pole figure plots of identical films.
Ferroelectric properties of PLZT films. (a) P-E hysteresis loops for pseudocubic, rhombohedral PLZT 8/65/35, and PLZT 0/52/48 films. (b) Ferroelectric polarization fatigue properties of PLZT 0/52/48 and PLZT 8/65/35 films deposited on substrates, where square voltage pulses with a frequency of 100 kHz, 300 kHz and an amplitude of ±40 V, ±25 V were used, respectively.
Electro-optic properties of PLZT films. (a) Comparison of the refractive index change (TM mode) of PLZT thin film with pseudocubic and rhombohedral phases deposited on substrate. (b) Electro-optic properties of PLZT films with varying La concentration.
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