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Volume 96, Issue 9 Front cover image - large version

Volume 96, Issue 9, 01 March 2010

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  • Hard x-ray nanobeam characterization by coherent diffraction microscopy
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Scitation: Applied Physics Letters - Volume 96, Issue 9
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/9
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