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High response deep ultraviolet organic photodetector with spectrum peak focused on 280 nm
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/content/aip/journal/apl/96/9/10.1063/1.3327833
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Image of FIG. 1.

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FIG. 1.

Absorption spectra of 30 nm thick neat m-MTDATA, Bphen, and their blend film with 1:1 weight ratio on quartz substrate, respectively.

Image of FIG. 2.

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FIG. 2.

Photocurrent response spectra of the PDs (Device-1, Device-2, and Device-3) with different thickness of TPD film. Inset: the transmission spectra of 40 nm thick TPD and 12 nm thick Al film at 200–450 nm.

Image of FIG. 3.

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FIG. 3.

(a) Photocurrent and dark current densities vs bias voltage for Device-3 under illumination of 280 nm UV light with an intensity of in logarithm. (b) Photocurrent density vs illumination intensity of 280 nm UV light for Device-3.

Image of FIG. 4.

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FIG. 4.

The dependences of photocurrents on operating time for the optimized PD diodes under a constant and shuttered illumination of 280 nm UV light with an intensity of at −2 V, respectively.

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/content/aip/journal/apl/96/9/10.1063/1.3327833
2010-03-01
2014-04-18

Abstract

A high response organic deep ultraviolet (DUV) photodetector(PD) with 280 nm as the response spectrum peak was demonstrated. A maximum photoresponse of 309 mA/W under 280 nm UVillumination with an intensity of and a detectivity of at −8 V were achieved, respectively. The optimized PD diode has a structure of ITO/m-MTDATA (10 nm)/m-MTDATA:Bphen(1:1, 60 nm)/Bphen (10 nm)/: Bphen (30 wt %,10 nm)/Al(12 nm)/TPD(40 nm). Under 280 nm constant and shuttered illumination conditions with an intensity of the operational time is longer than 440 min when its response respectively decreases to 50% and 83% of its original value. The realization of the DUV detection is attributed to the stronger absorption of shorter UV wavelengths of Bphen acceptor and covering UV waveband longer than 300 nm by the TPD layer. The more detailed mechanism of harvesting the high PD performance is also discussed.

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Scitation: High response deep ultraviolet organic photodetector with spectrum peak focused on 280 nm
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/9/10.1063/1.3327833
10.1063/1.3327833
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