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Hard x-ray nanobeam characterization by coherent diffraction microscopy
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10.1063/1.3332591
/content/aip/journal/apl/96/9/10.1063/1.3332591
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/9/10.1063/1.3332591
/content/aip/journal/apl/96/9/10.1063/1.3332591
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/content/aip/journal/apl/96/9/10.1063/1.3332591
2010-03-01
2014-11-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Hard x-ray nanobeam characterization by coherent diffraction microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/96/9/10.1063/1.3332591
10.1063/1.3332591
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